Please Note: All Cahn Litigation expert witness searches are customized to attorneys' precise specifications and preferences. Attorneys are encouraged to discuss search parameters with a Cahn search specialist.
The below expert witness bios represent a small fraction of those Hard Disk experts known by Cahn Litigation Services. These bios are provided to give attorneys a sense of the Hard Disk landscape.
This expert holds a Ph.D. in Computer Science and is a technical leader with many years of experience designing and supervising the design of digital circuits across a wide range of applications, including CPUs, ASICs within hard disk drives and LAN controllers. This expert has deep expertise in computer bus design and knowledge of bus standards, computer architect, is a college level lecturer and author of a book chapter on bus design, and has software expertise in operating systems and input/output subsystems. This expert has been a management and technical contributor with technology giants, and teaches courses at a University. Additionally, this expert has extensive prior litigation experience. This expert has been engaged as an expert in excess of 40 times, providing expert reports and declarations in more than half. This expert been he has testified in deposition and at trial, and served as a neutral technical advisor to three Federal District Court judges.
This expert is the principal of a successful storage consulting firm with extensive experience in all aspects of storage technology, interfaces, backup and restore products and file systems. Among this expert's areas of specialty are flash memory (memory cards, solid state disks, flash drives), optical storage (CD, DVD, WORM, Magneto-Optical), Magnetic Storage (hard disk, floppy disk, tape), RAID/Disk Arrays, cloud storage, PCMCIA and Storage Area Networks (SAN). This expert has participated in over fifty conferences and events as speaker, session chair and conference chair. Drawing on many years of experience in the storage industry and many years of experience as a computer engineer, this expert has been retained as an expert witness and/or expert consultant in nearly one hundred engagements involving patent, trade secret, copyright and patent portfolio reviews. Cases have involved technology in the storage, IC CAD, software and hardware industries. This expert has written expert reports, been deposed and has provided courtroom testimony at trial. Flash memory firmware and drivers were at issue in one case, and flash memory card reader circuitry was at issue in another for which he provided the critical trial testimony.
This expert holds a PhD in Materials Science and Engineering and serves as Associate Professor of Materials Science and Electrical Engineering. This expert utilizes analytical and high-resolution electron microscopy for materials characterization in order to develop structure-property relationships. Areas of interest include magnetic thin films for data storage and advanced structural materials. Further increases in the areal density for magnetic data storage will require new materials that can decrease the size of individual magnetic grains in the thin films. To develop the processing methods for growing these nanometer size features demands materials characterization with atomic resolution.
The majority of this expert's work has concentrated on magnetic materials. During this expert's post-doctoral studies, this expert performed research on Fe-Si alloys for soft-magnetic applications. This expert worked on permanent magnet materials such as Pt-Co-B alloys and this expert was involved in the development of magnetic-recording media for data storage for many years. This expert has over 30 publications concerning a number of different magnetic materials including CoPtCr longitudinal media, soft magnetic underlayers such FeTaN/IrMn and NiFe/IrMn multilayers, FePt/MgO multilayers, and FePt nanoparticles. This expert was a member of the International Magnetic Data Storage Consortium and has had research funding from many of the major hard drive manufactures.
Materials characterization using electron microscopy is the main thrust of this expert's research. This expert has excellent infrastructure for materials characterization that includes a scanning electron microscope with an energy dispersive spectrometer.
This expert has many years of experience as an expert for litigation primarily in failure analysis cases. This expert has been deposed and testified numerous times.